| |
SEMESTER II
10O201 LINEAR ALGEBRA AND FOURIER SERIES
vide Automobile
Engineering
10G202/10H102 MATERIAL
SCIENCE
vide Automobile
Engineering
10G203/10H103 ENVIRONMENTAL SCIENCE AND ENGINEERING
vide Automobile
Engineering
10O204 COMMUNICATION SKILLS
vide Automobile
Engineering
10G205/10G105/10H205 PROBLEM SOLVING AND C PROGRAMMING
vide Automobile
Engineering
10L206/10E206/10N2026 ELECTRON DEVICES
(Common to ECE/EEE/EIE)
3 1 0 3.5
|
UNIT I |
P-N JUNCTION DIODE |
8 |
|
V-I characteristics - static and dynamic resistance, Temperature
dependence of characteristics, diffusion and transition capacitances, Diode
as a circuit element, small signal and large signal models. Diode switching
times, p-n junction diode ratings. Breakdown phenomena in diodes - zener
diodes. The metal - semiconductor junction - Schottky barrier diodes. |
|
UNIT II |
bipolar junction transistor |
9 |
|
Physical behaviour of a BJT - Ebers - Moll model, large signal current
gains. Modes of transistor operation - Common base, common emitter and common
collector configurations, Input and output characteristics, Early
effect, regions of operation. AC and
DC load lines - Need for stability of Q-Point. Bias stability -fixed bias,
collector to base bias, self bias. Transistor switching times. High frequency
effects. BJT ratings. |
|
UNIT III |
field effect transistor |
8
|
|
JFET operation -
V-I characteristics, transfer characteristics, regions of operation. DC analysis - JFET biasing. Small signal JFET model, JFET as a switch, voltage variable
resistor and an amplifier.
mosfet:
Constructional details -
Operation of enhancement and depletion type MOSFETs , V-I characteristics,
transfer characteristics, Comparison of PMOS and NMOS devices. |
|
UNIT IV |
DEVICE fabrication |
9
|
|
Monolithic IC technology - Planar processes, Epitaxial growth,
Oxidation, Photolithography, Diffusion, Ion implantation, metallization. BJT fabrication - need for buried layer,
Junction and dielectric isolation, Fabrication of p-n-p, multiple emitter
transistors. Monolithic diodes. Fabrication of FETs, NMOS enhancement and
depletion MOSFETs, self isolation, CMOS technology. Monolithic IC Resistors:
sheet resistance - diffused, ion implanted, epitaxial, pinch, MOS and thin
film resistors. Monolithic IC capacitors - junction, MOS and thin film
capacitors. IC packaging.
Microelectronic circuit layout. |
|
UNIT V |
SPECIAL SEMICONDUCTOR DEVICES (Qualitative
Treatment only) |
11 |
|
Tunnel diodes -
PIN diode, varactor diode - SCR characteristics and two transistor equivalent
model - UJT - Diac and Triac - Laser, CCD, Photodiode, Phototransistor,
Photoconductive and Photovoltaic cells - LED, LCD.
TOTAL : 45 |
|
TEXT BOOKS: |
|
Sl. No. |
Author(s) |
Title of the Book |
Publisher |
Year of
Publication |
|
1. |
Millman J and Grabel A |
Microelectronics |
Tata McGraw-Hill Publishing Company Ltd., New Delhi, Third Edition. |
2000 |
|
2. |
Boylestead L R and Nashelsky L |
Electronic Devices and Circuit theory |
Pearson Education India,
New Delhi, Ninth Edition |
2006 |
|
REFERENCE BOOKS: |
|
Sl. No. |
Author(s) |
Title of the Book |
Publisher |
Year of
Publication |
|
1. |
Adel S Sedra and Kenneth C Smith |
Microelectronic Circuits |
Oxford University Press, Newyork, Fourth Edition |
1998 |
|
2. |
Thomas L Floyd |
Electronic Devices |
Pearson Education India,
New Delhi,
Seventh Edition. |
2007 |
|
3. |
David A Bell |
Electronic Devices and Circuits |
Prentice Hall of India, New
Delhi, Fourth Edition. |
2000 |
|
WEB URLs:
- http://www.electronics-tutorials.ws/diode/diode_3.html
- http://www.allaboutcircuits.com/vol_3/chpt_4/1.html
- http://www.tpub.com/neets/book7/26i.htm
- http://www.icknowledge.com/misc_technology/fundamentalprinciples.html
|
|